Discover innovative solutions that reflect Koh Young’s latest technology.
Solutions / Industrial / DPI / Neptune T
Most optical systems use UV light to inspect the surface for presence and gauges to measure material thickness in a particular spot, which does not provide the accuracy and repeatability needed. Inspecting transparent materials proved to be a challenge for traditional laser-confocal or electron microscope systems that only measure three-dimensional shapes.
Koh Young’s revolutionary Neptune T provides the ultimate solution to these challenges.
Koh Young developed a non-destructive thickness measurement solution for transparent materials. The system allows manufacturers to explore depths of its process and accurately identify defects with 2D, 3D, and cross-section views.
The Koh Young L.I.F.T technology delivers non-destructive 3D inspection to precisely measure and inspect fluids that are wet or dry. Based on low-coherence interferometry, L.I.F.T. employs Near Infrared (NIR) Light to capture images through multiple layers of a fluid structure regardless of transparency. This patented technology provides the most accurate and reliable 3D inspection across any surface – Smooth, uneven, or rough.
Not limited to conformal coating, the Neptune T measures underfill, epoxy, bonding, glue, and more to deliver an accurate measurement of transparent, translucent, and pigmented materials. The system is currently suited for acrylic, silicone, polyurethane, water-based, UV- cure, and hybrid coatings with additional materials being investigated.
The Neptune T handles several types of applications from research labs to high volume production.
The Neptune T is the world’s first 3D optical measurement instrument for transparent materials. It is available for coating, underfill, epoxy, glue, and bonding material inspection. With its patented L.I.F.T. technology, the Neptune T provides accurate thickness measurement of even the most transparent materials. The system allows manufacturers to explore depths of its process and accurately identify defects with 2D, 3D, and cross-section views.