Koh Young Unveils Breakthrough Innovations at Productronica and SEMICON Europa 2025

Press Release Absolute No.1 Inspection Company Koh Young Unveils Breakthrough Innovations at Productronica and SEMICON Europa 2025     Seoul, Korea – Koh Young, the industry leader in True 3D measurement-based inspection and metrology solutions, will showcase a wave of innovations at Productronica and SEMICON Europa 2025, taking place November 18–21 at Messe München, Germany. […]

Koh Young to Showcase Semiconductor Metrology and Advanced Packaging Inspection Solutions at iMAPS 2025 in San Diego

Press Release Absolute No.1 Inspection Company Metrology and Advanced Packaging Inspection Solutions at iMAPS 2025 in San Diego     Seoul, Korea – Koh Young Technology, the global leader in True 3D measurement-based metrology and inspection solutions, will make its first appearance at iMAPS 2025, the premier event for microelectronics and advanced packaging, taking place […]

Koh Young, Fuji, and Kurtz ERSA Drive Smart Manufacturing Solutions for EV and Automotive Electronics at Kunshan, China Technical Seminar

Press Release Absolute No.1 Inspection Company Koh Young, Fuji, and Kurtz ERSA Drive Smart Manufacturing Solutions for  EV and Automotive Electronics at Kunshan, China Technical Seminar   Seoul, Korea – Koh Young Technology, the global leader in True 3D measurement-based inspection solutions, partnered with Fuji Corporation and Kurtz ERSA to host an exclusive technical seminar […]

Koh Young highlighting Award-winning True3D Inspection Solutions at SMTA International 19-23 October 2025

Press Release Absolute No.1 Inspection Company Koh Young highlighting Award-winning True3D Inspection Solutions at SMTA International 19-23 October 2025   Atlanta, Georgia – Koh Young Technology, the industry-leader in True 3D measurement-based inspection solutions and the Gold Sponsor of SMTA International, will be demonstrating its award-winning inspection solutions in Booth 2817 at the Donald E. Stephens Convention Center on October 19-23, 2025. Automated Optical Inspection (AOI) […]

Koh Young Showcases Advanced Dimensional Metrology and Inspection Solutions for Semiconductor and Wafer-Level Packaging at SEMICON West

Seoul, Korea – Koh Young Technology, the industry leader in True 3D™ measurement-based dimensional metrology and inspection solutions, will present its latest advancements for semiconductor and advanced packaging applications at SEMICON West 2025 in Booth 5949. The show will take place in its new venue at the Phoenix Convention Center from October 7–9, 2025 in […]