Ray Welch from Koh Young will Present a Paper on the Importance of Solder Paste Inspection at SMTA Tampa Bay Expo on 30 October 2023

Atlanta, Georgia – Koh Young Technology, the leader in True 3D measurement-based inspection solutions changed the industry over 20-years ago with its multi-projection solder paste inspection machine. The electronics manufacturing industry quickly adopted the patented technology, which is now the de facto standard SPI machine in the market. On 30 October during the SMTA Tampa […]

Koh Young Showing PCBA and Semiconductor Inspection Innovations at Productronica on November 14-17, 2023 at Messe München

Alzenau, Germany – Koh Young, the industry leader in True 3D measurement-based inspection solutions, will highlight live demonstrations of its award-winning inspection and measurement solutions for printed circuit board, advanced packaging, and semiconductor assembly at Productronica, the highly-anticipated trade fair in Messe München on November 14-17, 2023 in Munich, Germany. Koh Young will have two […]

Koh Young highlighting Award-winning True 3D Inspection Solutions at SMTA Guadalajara Expo 25-26 October 2023

Atlanta, Georgia – Koh Young Technology, the industry leader in True 3D measurement-based inspection solutions, will deliver live demonstrations of its award-winning inspection machines and smart factory software during the SMTA Guadalajara Expo and Tech Forum in Jalisco, Mexico on October 25-26, 2023. Additionally, Heriberto Cuevas, Regional Sales Manager for Mexico will take part in […]

Joel Scutchfield from Koh Young will Discuss the Journey to Realize AI for the Electronics Industry at the SMTA Ontario Conference on 16 October 2023

Atlanta, Georgia – Koh Young Technology, the leader in True 3D measurement-based inspection solutions, will discuss the increasingly significant role of data collection and analysis to enable Generative Artificial Intelligence (GenAI) functionality to improve productivity in our industry. On 16 October during the one-day SMTA Ontario Technical Conference, Joel Scutchfield, General Manager of SMT Business […]

Ivan Aduna from Koh Young will Present a Paper on How AI Supports Realtime Process Control at SMTA International 10-11 October 2023

Atlanta, Georgia – In addition to bringing several of its industry-leading True 3D measurement-based inspection solutions to SMTA International for live demonstrations, Koh Young, the premier show and expo sponsor, is excited to announce Ivan Aduna, Global MES Manager will present a paper about how AI-powered tools can support real-time process control. During the technical […]

Koh Young highlighting Award-winning True 3D Inspection Solutions at SMTA International 10-11 October 2023

Atlanta, Georgia – Koh Young Technology, the industry-leader in True 3D measurement-based inspection solutions and the premier sponsor of SMTA International, will be presenting whitepapers and delivering live demonstrations of its award-winning inspection and measurement solutions in Booth 1421 at the Minneapolis Convention Center in Minnesota on 10-11 October 2023. The following is just a […]

Koh Young Showcases the Industry-leading Solutions at Productronica India 2023 at two booths : NMTronics and Panasonic Connect

Seoul, South Korea – Koh Young, the industry leader in True 3D measurement-based inspection solutions, will be showcasing its revolutionary solutions at Productronica India 2023 with NMTronics India from September 13-15, 2023. There will be two solutions, Automated Pin Inpsection and Dispense Process Inspection solutions, that are designed to solve the difficult challenges faced at various […]

Koh Young shows its Revolutionary Solutions at two booths in NEPCON Vietnam Hanoi 2023 

Seoul, South Korea – Koh Young, the industry leader in True 3D measurement-based inspection solutions, is pleased to announce its participation in Hanoi, Vietnam from September 6-8, 2023. This time, Koh Young is collaborating with two of our dear partners, Fuji and SiP to introduce our revolutionary solutions to solve the challenges you face at […]