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Meister D/D+
Solutions / Industrial / SIS / Meister D/D+
The Meister D is a perfect solution for production-speed 3D inspection for component and die inspection solution targeting die and small MLCCs using an integrated measurement tool with defect analysis software based on advanced optics and AI engines. The system inspects micro cracks, chipping, foreign material, and more.
The Meister D+ combines industry-leading Moiré technology and Koh Young’s proprietary new optics to support 3D inspection of highly reflective dies (mirror surface), a long-term inspection challenge.
The Meister D is the Koh Young AOI solution targeting the demanding SEMICON-level products utilizing high density placements and mirror-surfaced components. In addition to the Zenith AOI feature set, the Meister-D delivers additional features required for SEMICON-level products.
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We are thrilled to announce that Koh Young Technology has been awarded the inaugural Ahn Jung-geun Patriotic Entrepreneur Award by Global Seah Group and Maeil Business Newspaper. This prestigious honor, recommended by esteemed organizations like KOTRA and the Korea International Trade Association, recognizes our commitment to patriotism through international exports.
Since our founding in 2002, Koh Young has become a global leader in 3D inspection solutions, with our SPI and AOI technologies playing crucial roles in various industries. We are proud to have maintained our position as the world’s No. 1 inspection market leader since 2006, showcasing Korea’s technological prowess on the global stage.
We look forward to continuing our journey of innovation and excellence, helping businesses worldwide reach new heights.
Thank you for your continued support!
