Koh Young Showcases Advanced Packaging and Wafer-Level Inspection at SEMICON Europa 2026

Press Release Absolute No.1 Inspection Company Koh Young Showcases Advanced Packaging and Wafer-Level Inspection at SEMICON Europa 2026 Alzenau, Germany – Koh Young, the industry leader in True 3D measurement-based inspection and metrology solutions, will showcase its Meister D+ and ZenStar systems at SEMICON Europa 2026, taking place 10–13 November at Messe München, Germany. Visitors […]

Koh Young Technology Showcasing its Inspection Solutions at electronica and SEMICON Europa in Munich on November 12-15, 2024

Alzenau, Germany – Koh Young Technology, the global leader in True 3D measurement-based inspection solutions, will demonstrate its award-winning inspection solutions at Messe München on November 12-15, 2024. At electronica Booth A3.358, our team of experts will be on hand to discuss how our AOI, SPI and DPI solutions boost your quality and increase your […]