Koh Young Future Forum 2023 : 3rd Session
“Powered by Generative AI: Accelerating Inspection Advancements“ 2023-09-25 – Seoul, Korea – Koh Young, the industry leader in True 3D measurement-based inspection solutions, is eager to explain how Generative AI can maximize efficiency and improve production performance. We will present our first sessions on October 30 in English for our users in the Americas region. […]
Koh Young Future Forum 2023 : 2nd Session
“Essential Inspection Requirements for the Era of Convergence: Optimizing the Semiconductor and SMT Processes” 2023-05-18 – Seoul, Korea – Koh Young, the industry leader in True 3D measurement-based inspection solutions, is pleased to announce the second online seminar in our captivating year-long series. This exclusive online event promises to be a valuable and insightful experience, […]
[EPP Europe] Innovative solutions for semiconductor packaging at ESTC
[EPP Europe] Applying 3D Moiré Interferometry Measurement to SemiCon Applications
[EPP Europe] Reliance on Innovative Packaging Presents Opportunities and Challenges for Europe’s Chip Experts
