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Neptune C+
Solutions / Industrial / DPI / Neptune C+
Most optical systems use UV light to inspect the surface for presence and gauges to measure material thickness in a particular spot, which does not provide the accuracy and repeatability needed. Inspecting transparent materials proved to be a challenge for traditional laser-confocal or electron microscope systems that only measure three-dimensional shapes.
Koh Young’s revolutionary Neptune C+ provides the ultimate solution to these challenges.
Koh Young developed a non-destructive thickness measurement solution for transparent materials. The system allows manufacturers to explore depths of its process and accurately identify defects with 2D, 3D, and cross-section views.
The system accurately measures materials for coverage, thickness, and consistency with user-defined threshold setting. It also inspects bubbles and other defects as small as 200-micros, even inspecting “keep out” areas for 100-micron splash marks.
The Koh Young L.I.F.T technology delivers non-destructive 3D inspection to precisely measure and inspect fluids that are wet or dry. Based on low-coherence interferometry, L.I.F.T. employs Near Infrared (NIR) Light to capture images through multiple layers of a fluid structure regardless of transparency. This patented technology provides the most accurate and reliable 3D inspection across any surface – Smooth, uneven, or rough.
With its proprietary machine learning technology, the Neptune C+ offers enhanced inspection capabilities enabling autonomous bubble inspection without teaching and endless tuning.
Not limited to conformal coating, the Neptune C+ measures underfill, epoxy, bonding, glue, and more to deliver an accurate measurement of transparent, translucent, and pigmented materials. The system is currently suited for acrylic, silicone, polyurethane, water-based, UV-cure, and hybrid coatings with additional materials being investigated. The Neptune C+ handles several types of applications from research labs to high volume production.
The Neptune C+ programming software provides a hands-on user interface, which emulates a simple raster graphics editor to allow intuitive programming with great flexibility. Programming is further simplified with our wizard-based graphical user interface. All parameters can be adjusted for quick setup and fast changeovers.
Koh Young offers a function that inspects both the top and bottom of PCBs with a flipper option.
Koh Young offers a perfect solution for extra-long boards like LED lighting up to 1,300mm, which can be extended up to 1,800mm with a long board option.
© Koh Young Technology, Inc. 2022 and/or its subsidiaries. All rights reserved.
We are thrilled to announce that Koh Young Technology has been awarded the inaugural Ahn Jung-geun Patriotic Entrepreneur Award by Global Seah Group and Maeil Business Newspaper. This prestigious honor, recommended by esteemed organizations like KOTRA and the Korea International Trade Association, recognizes our commitment to patriotism through international exports.
Since our founding in 2002, Koh Young has become a global leader in 3D inspection solutions, with our SPI and AOI technologies playing crucial roles in various industries. We are proud to have maintained our position as the world’s No. 1 inspection market leader since 2006, showcasing Korea’s technological prowess on the global stage.
We look forward to continuing our journey of innovation and excellence, helping businesses worldwide reach new heights.
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