NEPCON JAPAN 2026

NEPCON JAPAN迎来第40届，是亚洲领先的电子制造与研发技术专业展览，吸引超过1,850家全球企业和92,000多名参观者。

欢迎莅临NEPCON JAPAN 2026，了解高迎强大的检测技术！

• 展会日期：2026年1月21日 (星期三) – 1月23日 (星期五) , 10:00 – 17:00
• 展会地点：Tokyo Big Sight, Tokyo, Japan 
• 展位号： E13-32

高洋还将在**新产品·新技术研讨会 Exhibitors’ Product / Technology Seminar -New TechTrend-上进行特别演讲。

期待您的关注与参与。

会议详情

• 主题：Optimizing Inspection Processes and Reducing Workforce
• 会场： Exhibitors’ Product/Technology Seminar ~New Tech Trend~ Venue①
• 时间：1月21日（星周三）14:00 – 14:30
• 演讲者：服部友彦 (JKY GM)

As component miniaturization and tighter mounting pitches advance, inspections such as SPI and AOI (pre- and post-reflow optical inspection) have become essential at each assembly stage. However, recipe creation, parameter tuning, and false call reduction still require significant engineering effort, limiting labor efficiency.

This presentation introduces an AI-driven approach to inspection process optimization. Koh Young’s automatic programming (KAP) and Smart Review leverage actual production results to automatically optimize inspection parameters, reducing setup workload and engineering dependency while improving productivity and maintaining stable quality.